Header
 
 
 
 
 

Technology

As the defense and space sectors rely on commercial components that are susceptible to radiation in space, there is a rapidly growing need for DEC design development and technology that combines commercial integrated circuits (ICs) with chip and system-level mitigation techniques to avoid or recover from reliability faults. DEC is now developing innovative radiation-hardened by design (RHBD) monitoring techniques that extend the reliability of electronic systems by mitigating the effects of reliability defects including electromigration (EM), hot carrier injection (HCI), time dependent dielectric breakdown (TDDB), negative bias thermal instability (NBTI), thermal effects, and radiation effects. DEC’s strategic focus is on extended reliability techniques and approaches that minimize the impacts due to reduced feature size, while enabling portability and the rapid migration of the technology to process independent commercial foundries. DEC’s solutions will help to provide significant new capabilities to space electronics system developers. In addition to other space-related needs for this technology, DEC’s R&D work also includes the collaboration with several key corporations involved in space electronics technology for defense, aerospace, and national security applications. Recent work includes testing with radiation and reliability issues for modern electronics that are important to defense, space, national security, missile defense, and space exploration.